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Figure 1. Optical images of L929 cell for AFM (a) and SICM (b). Each probe was positioned at the apex of the single cell. Jake Kim, Moses Lee and Cathy Lee, Park Systems Corp.,

 Figure 1. Topography (top-left) resistance (top-right) and conductance (middle-left) images acquired from an LIB electrode sample. Line profile (middle-right): Topography line profile (red line, y-axis on left), resistance line profile (green, y-axis on

John Paul Pineda, Charles Kim, Cathy Lee, Byong Kim, and Keibock Lee, Park Systems Inc., Santa Clara, CA USA Introduction Scanning Kelvin probe microscopy (SKPM) is a tool used to measure work function and local electrical

Alvin Lee, John Paul Pineda, Byong Kim, Park Systems Inc., Santa Clara, CA USA Introduction In recent years, the importance of mechanical properties measurement has become evident in various applications, ranging from understanding and screening of

– Scanning Electrochemical Microscopy (SICM-SECM) Wenqing Shi, Cathy Lee, Gerald Pascual, John Paul Pineda, Byong Kim, Keibock Lee, Park Systems Inc., Santa Clara, CA USA Introduction Since the inception of scanning tunneling microscopy (STM) [1], electrochemists

Wenqing Shi, Gerald Pascual, Byong Kim, and Keibock Lee Park Systems Inc., Santa Clara, CA USA Abstract Nanoscale frictional measurement, or nanotribology, is an effective approach to identify surface compositional differences for a wide variety of

Textile Nanocharacterization: Topography, Phase Imaging and Nanomechanical Property Investigation of Polyester Yarn Interaction with Silicon Matrix   Gerald Pascual, Byong Kim, Mina Hong, John Paul Pineda, and Keibock Lee Technical Marketing, Park Systems Abstract Textiles research and development

Automated Non-Destructive Imaging and Characterization of Graphene/hBN Moiré Pattern with Non-Contact Mode AFM Ardavan Zandiatashbar, Byong Kim, Young-kook Yoo, Keibock Lee, Park Systems Inc., 3040 Olcott St., Santa Clara, CA 95054 Introduction Graphene has attracted researchers’ attention

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