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Magazine
Current Issue
Volume 23 | 03 Feb 2022
NANOscientific Magazine, Park Systems Special Edition
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Nanotechnology
Nanomechanical Properties of Lipid Vesicles Using Atomic Force Microscopy
The unique structures of liposomes – lipid vesicles (spherical structures with a bilayer membrane) of varying size and structural complexities within other lipid vesicles – have been utilized to serve as a drug delivery mechanism over an extended period o
22 May 2022
Nanotechnology
Designing a New Class of Atomic Force Microscope –Park FX40 The Automatic AFM
A decade is sufficient for market disruption and adaptation in Atomic Force Microscope (AFM) industry. Park Systems Corp.
13 Jan 2022
Electrical & Electronics
Quantitative frictional properties measurement using atomic force microscopy
Atomic force microscopy (AFM) is a powerful tool that can be used to obtain information on surface morphology of target materials in correlation with their frictional, electrical, mechanical, and thermal properties at the nano-scale. In particular, Later
17 Mar 2022
Life Science
Nanotechnology
The Nexus between Nanotechnology and Society 5.0
Nanotechnology is Life’s Engineering, and has been present in our lives since its beginning, closely linked to the functioning of organisms and an essential part of Nature's tools to create all its diversity
02 Jun 2023
2D Materials
Electrical & Electronics
Evaluation of Local Mechanical and Chemical Properties via AFM as a Tool for Understanding the Formation Mechanism of Pulsed UV LaserNanoinduced Patterns
Aromatic polyimides containing side azo-naphthalene groups have been investigated regarding their capacity of generating surface relief gratings (SRGs) under pulsed UV laser irradiation through phase masks, using different fluencies and pulse numbers. T
13 Jan 2022
2D Materials
Electrical & Electronics
Simultaneous Acquisition Of Current and Lateral Force Signals
Atomic force microscopy (AFM) is central to investigating the piezoelectric potentials of one-dimensional nanomaterials.
08 Jun 2023
Breaking News
Let There Be Light!
Park Systems recently announced Park NX-Hybrid WLI, the first fully integrated system that combines Atomic Force Microscopy (AFM) with White Light Interferometer (WLI) profilometry. White light interferometry (WLI) is a nondestructive, non-contact, optica
13 Jan 2022
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