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Symposium
NSS Americas
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Current Issue
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Magazine
Current Issue
Volume 24 | 02 May 2023
NANOscientific Magazine, Spring 2023
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Electrical & Electronics
NanoScientific Interview with Dr. Kim Mckelvey
This interview is a follow up to Dr. McKelvey’s recent article published In Nature journal: Isolation of pseudocapacitive surface processes at monolayer MXene flakes reveals delocalized charging mechanism.
12 Jun 2023
2D Materials
Characterization of 2D materials by imaging spectroscopic ellipsometry (ISE)
2D materials, which have the potential to revolutionize entire areas of technology, require decisive tasks to advance developments quickly and efficiently.
31 May 2023
2D Materials
Functional polymeric passivation-led improvement of bias stress with long-term durability of edge-rich nanoporous MoS<sub>2</sub> thin-film transistors
Nanoporous patterning of two-dimensional materials using block copolymer lithography has drawn much attention. Lateral edge exposures made by the nanoporous patterning provide electrical and optical characteristics that are different from the original mat
02 Jun 2023
Electrical & Electronics
How to tailor the crystallographic orientation evolution and surface morphological features of polycrystalline conductive N-type ZnO films
Highly transparent conductive oxide (TCO) films, such as n-type In2 O3 - and ZnO-based films, are of great interest for use as transparent conducting electrodes in optoelectronic devices (e.g., photovoltaic solar cells and flat displ
02 Jun 2023
Manufacturing
Pioneering Film Deposition Technology Unconstrained By The Field Framework
An interview with Professor Tetsuya Yamamoto at Materials Design Center, Kochi University of Technology
02 Jun 2023
2D Materials
Surface potential characterization of two-dimensional materials through back-gate voltage biases
Two-dimensional (2D) materials including semi-metallic graphene, semiconducting transition metal dichalcogenides (TMDs), and insulating hexagonal boron nitride (hBN), have been studied in recent years as electrically or photonically innovative materials.
02 Jun 2023
Electrical & Electronics
Manufacturing
Mapping the registry and functional properties of layered materials heterostructures using conductive atomic force microscopy
Manipulating the registry of layers within layered materials heterostructures leads to changes in their functional properties both locally and at scales relevant to devices .
02 Jun 2023
Breaking News
Park Systems Introduces Park NX-IR R300 and Park NANOstandard
Park Systems, a leading manufacturer of atomic force microscopy (AFM) and nano metrology systems, has launched two new products to its portfolio of nanoscale metrology solutions for the semiconductor industry.
12 Jun 2023
Breaking News
Park Systems Corporation Acquires Accurion GmbH
Park Systems has made a strategic move to expand its business portfolio by acquiring Accurion GmbH. The Germany-based company specializes in developing and manufacturing imaging spectroscopic ellipsometers (ISE) and active vibration isolations (AVI).
09 Jun 2023
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