Mapping Moire Patterns with Torsional Force Microscopy
This talk will explore the use of torsional force microscopy to map the electronic properties of twisted bilayer graphene and other moire materials. We will discuss recent advancements in measurement techniques and theoretical understanding, shedding light on the rich physics of these engineered quantum materials.
From Lab Bench to Global AFM Business Leadership: 40 Years of AFM Innovation and Business Challenges
A retrospective on four decades of atomic force microscopy development, from its earliest implementations to the sophisticated instruments of today. This talk covers the technical milestones, business challenges, and strategic decisions that shaped the AFM industry.
Pushing the Limits of Microwave Impedance Microscopy: Toward High-Precision, Quantitative, and Multimodal Nanoscale Characterization
This presentation introduces recent breakthroughs in microwave impedance microscopy (MIM), demonstrating high-precision, quantitative measurements at the nanoscale. We combine MIM with complementary modalities to achieve multimodal nanoscale characterization of complex materials and devices.
Group Photo & Networking Break
Active AFM Cantilevers and the New Research They Enable
Active cantilevers represent a paradigm shift in AFM technology. This talk showcases how integrated sensing and actuation capabilities are opening new frontiers in high-speed imaging, multifrequency measurements, and bio-nanomechanical studies.
Advancing Nanoscale Characterization with Novel Probe Techniques
An exploration of emerging probe-based techniques that push the boundaries of nanoscale characterization. This talk highlights practical applications in semiconductor metrology, materials science, and biological imaging.
Merging Argostic and Atomic Force Microscopes to Probe Physical Properties of Surfaces and Buried Layers with Nano Resolution
We present a novel approach combining argostic and atomic force microscopy to probe subsurface physical properties with nanometer resolution. Our method enables non-destructive imaging of buried interfaces and layers in advanced materials and devices.
Some History of Development and Scanning Probe Microscopes for Nano Science and Technology
A historical perspective on the evolution of scanning probe microscopes, from the earliest tunneling microscope to modern multimodal SPM platforms. This talk reflects on the key discoveries and inventions that made nanoscale science and technology possible.
Next-Generation Scanning Probe Lithography for Quantum Device Fabrication
An overview of scanning probe lithography techniques applied to the fabrication of quantum devices, including single-atom transistors and spin qubits in silicon.
High-Speed AFM for Real-Time Visualization of Molecular Dynamics
High-speed AFM enables direct observation of biomolecular dynamics in real time. This talk showcases recent results on protein conformational changes and membrane dynamics captured at video rate.
Coffee Break & Poster Session
Machine Learning Approaches for Automated SPM Data Analysis
Machine learning is transforming how we analyze SPM data. This talk presents deep learning architectures for automated feature recognition, property mapping, and experiment optimization in scanning probe microscopy.
