Few researchers have shaped the field of atomic force microscopy as profoundly as Prof. Franz Giessibl. From his early work with Nobel laureate Gerd Binnig during the formative years of AFM to the invention of the qPlus sensor that transformed high-resolution force microscopy, Giessibl has remained at the forefront of atomic-scale imaging for more than three decades.

Atomic Force Microscopy (AFM) has become an essential tool for nanoscale surface characterization, enabling high-resolution analysis of surface morphology, mechanical response, and functional properties across a broad range of materials. Its ability to image both conductive and insulating samples makes AFM especially valuable for studying crystalline surfaces, two-dimensional materials, and other nanoscale structures where localized surface information is critical.

The rapid emergence of advanced nanomaterials has created enormous opportunities for next-generation electronics, photonics, quantum devices, and sensing technologies. However, as material systems become increasingly sophisticated, one challenge continues to grow alongside them: characterization at scale.

Atomic force microscopy (AFM) is widely used to observe nanoscale structures and measure the mechanical and physical properties of materials. One of the important capabilities of AFM is its ability to operate under liquid environments, which allows researchers to characterize materials and biological systems under conditions closer to their natural state. However, successful AFM observation in liquid requires careful attention to measurement conditions, especially to sample preparation and fixation.

Cetyltrimethylammonium bromide (CTAB) is one of the most widely used surfactants in the aqueous synthesis of colloidal gold nanocrystals. Although essential for directing crystal growth and stabilizing nanoparticles during synthesis, residual CTAB can significantly influence nanoparticle performance in applications such as catalysis, sensing, and electrochemistry.

As the world accelerates its transition toward renewable energy, solar photovoltaics (PV) continue to play a central role in reducing dependence on fossil fuels while reducing greenhouse gas emissions.

Nearly every digital camera, from smartphones to scientific imaging systems, relies on a technology that has changed surprisingly little over the past two decades. While image sensors have become smaller, faster, and more sensitive, they still depend on tiny color filters placed over individual pixels to distinguish red, green, and blue light. These filters make color photography possible, but they also create one of the greatest inefficiencies in modern imaging by blocking much of the light before it ever

Atomic force microscopy is best known as a powerful tool for imaging and characterizing surfaces at the nanoscale. However, the ability of an AFM probe to interact directly with a material also makes the technique attractive for nanomanufacturing. By controlling the motion, force, and electrical properties of the probe, AFM systems can be used to create nanoscale structures without the masks and complex processing infrastructure required by many conventional lithography techniques.

Park Systems has introduced the NX1, a new atomic force microscope (AFM) designed to deliver atomic-resolution imaging under ambient laboratory conditions. Developed in collaboration with Prof. Franz J. Giessibl of the University of Regensburg, the system transforms a research prototype into a commercial instrument, enabling a level of performance that has traditionally required ultra-high vacuum environments.