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Keynote Speaker

Dr. Andrea Cerreta

Park Systems Europe, Mannheim, Germany

Correlating Electrical SPM Modes

 

Dr. Andrea Cerreta

 

Atomic Force Microscopy (AFM) is a versatile technique to study the properties of materials at interfaces. Being introduced to obtain high resolution maps of the surface topography on the most different samples, it has proven to be able to provide much more than that. In fact, the AFM probe is sensitive to all a range of forces of different nature from which electrical, magnetic, and mechanical information about the underlying samples can be assessed.

In particular, the use of conductive AFM probes and the combination of the AFM setup with advanced hardware allowed developing all a series of modes with specific goals, such as Conductive AFM to map the sample conductivity and for IV spectroscopy; Kelvin Probe Force Microscopy to study the surface potential; Piezoelectric Force Microscopy to understand the piezo/ferroelectric behaviour of materials.

Other modes such as Scanning Capacitance Microscopy and Scanning Microwave Impedance Microscopy have been conceived to characterize the doping of semiconducting materials; and finally, related techniques such as Scanning Tunneling Microscopy and Scanning Electrochemical Microscopy make use of specific probes different from the classical AFM cantilevers, but also supply information on the local charge distribution on the surface of materials.

What makes AFM versatile is not only the possibility to implement all these modes, but also the fact that some of them can be easily applied to the same area of the samples under investigation, with a minimal hardware modification or even simultaneously. This allows gathering evidence about the materials’ properties from different sources, enabling researchers to access to a more complete understanding of their samples all at once.

In this talk, a general introduction of the concept and scope of the main electrical AFM modes will be provided. Moreover, examples of correlative AFM-based experiments making use of electrical modes will be discussed. Finally, it will be shown how electrical modes can produce contrast maps with high lateral contrast, in particular for 2D materials.

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