Forum Europe
17 - 19 September, 2025 | Orsay, France
Overview
About NANOscientific Forum
Location & Host
Program
Hands-on Sessions
The NSFE is part of the NANOscientific Symposium Series that takes place annually around the globe. Each event covers a broad spectrum of topics such as electrical properties in semiconductors, 2D materials, surface science, spectroscopic ellipsometry, and molecular biology, with a special emphasis on the practical applications of nanoscience in both industry and academia.
The European edition, NSFE, is an open SPM User Forum focusing on sharing and exchanging cutting-edge research for both materials and life science disciplines using Atomic Force Microscopy (AFM) and Imaging Spectroscopic Ellipsometry (ISE). It offers participants the opportunity to present their research and come together for scientific talks, networking sessions, and live demonstrations of Park Systems instruments. Thus, the conference reinforces collaboration within the European Scanning Probe Microscopy (SPM) community and fosters future advancements in nanoscience.
The 8th edition of the NANOscientific Forum Europe will take place from the 17th to the 19th of September 2025 at the Laboratory of Solid State Physics (LPS), located in Orsay, France, about 25 km southwest of Paris. The scientific focus this year will be on Magnetic Force Microscopy and 2D Materials, as well as innovative methods in nanotechnology and correlative microscopy.
The LPS is a research institute of the Paris-Saclay University, associated with the National Center of Scientific Research (CNRS) as a joint research unit (French UMR 8502). Their research in condensed matter physics is divided into three main topics:
- New electronic states of matter
- Physical phenomena with reduced dimensions
- Soft matter including biological systems
The faculty researchers are actively involved in teaching undergraduate and graduate courses, particularly in the "Physics of Condensed Matter" master’s program. They also engage in large-scale outreach actions, such as the Year of Superconductivity and the International Year of Crystallography.
This year’s host, Dr. Stanislas Rohart, is a staff researcher at the LPS. A specialist in magnetic imaging (STM and MFM) and micromagnetism, he pioneered investigations on the Dzyaloshinskii-Moriya interaction in ultrathin films and its consequences on chiral domain walls and skyrmions. His present research mostly focuses on magnetic skyrmions in ferromagnetic and magnetically compensated films. He is the author of more than 50 papers in international journals.
The scientific focus this year will include Magnetic Force Microscopy and 2D Materials, as well as new developments and innovative methods in nanotechnology and correlative microscopy. Attendees will have the opportunity to hear from and engage with distinguished keynote speakers, such as our host Stanislas Rohart and Dr. Rebeca Ribeiro-Palau from C2N, among others.
The event will extend beyond scientific discussions and offer participants many networking opportunities, such as the conference dinner on a scenic Seine river cruise and the social event at a local winery.
As in previous years, there will be Hands-on Sessionson Park Systems tools, showcasing basic and advanced measuring techniques, as well as tips and tricks on how to obtain stunning AFM and ISE data:
See nanoscale characterization redefined with Park’s FX200 IR AFM. From high-precision PiFM-based IR spectroscopy to automated laser alignment and advanced AFM modes, this system delivers unmatched insight into nanomechanical, electrical, and thermal properties.
Experience how Ellipsometry visualizes buried interfaces, anisotropic structures, and fluid interlayers in real time, and bring your own samples to see them come alive under the lens of Mueller Matrix Ellipsometry. And much, much more.
Park Systems Intruments, you will get to see live:
- FX200 IR AFM - integrating nanoscale infrared (IR) spectroscopy with atomic force microscopy (AFM) to deliver advanced chemical and materials characterization.
- FX40 AFM - the automatic AFM streamlines data collection, research workflows, and data publication, empowering accelerated scientific progress and discovery.
- NX10 AFM - the premier choice for cutting-edge materials science research that provides ease of use with high-resolution capabilities.
- Accurion Simon - combining the sensitivity of thickness and refractive index measurements with the imaging capabilities of microscopy.
- Lyncée Tec DHM - recording holograms produced by the interference between the beam transmitted through the sample, and a reference beam generated inside of the microscope.
The European edition, NSFE, is an open SPM User Forum focusing on sharing and exchanging cutting-edge research for both materials and life science disciplines using Atomic Force Microscopy (AFM) and Imaging Spectroscopic Ellipsometry (ISE). It offers participants the opportunity to present their research and come together for scientific talks, networking sessions, and live demonstrations of Park Systems instruments. Thus, the conference reinforces collaboration within the European Scanning Probe Microscopy (SPM) community and fosters future advancements in nanoscience.
The 8th edition of the NANOscientific Forum Europe will take place from the 17th to the 19th of September 2025 at the Laboratory of Solid State Physics (LPS), located in Orsay, France, about 25 km southwest of Paris. The scientific focus this year will be on Magnetic Force Microscopy and 2D Materials, as well as innovative methods in nanotechnology and correlative microscopy.
The LPS is a research institute of the Paris-Saclay University, associated with the National Center of Scientific Research (CNRS) as a joint research unit (French UMR 8502). Their research in condensed matter physics is divided into three main topics:
- New electronic states of matter
- Physical phenomena with reduced dimensions
- Soft matter including biological systems
The faculty researchers are actively involved in teaching undergraduate and graduate courses, particularly in the "Physics of Condensed Matter" master’s program. They also engage in large-scale outreach actions, such as the Year of Superconductivity and the International Year of Crystallography.
This year’s host, Dr. Stanislas Rohart, is a staff researcher at the LPS. A specialist in magnetic imaging (STM and MFM) and micromagnetism, he pioneered investigations on the Dzyaloshinskii-Moriya interaction in ultrathin films and its consequences on chiral domain walls and skyrmions. His present research mostly focuses on magnetic skyrmions in ferromagnetic and magnetically compensated films. He is the author of more than 50 papers in international journals.
The scientific focus this year will include Magnetic Force Microscopy and 2D Materials, as well as new developments and innovative methods in nanotechnology and correlative microscopy. Attendees will have the opportunity to hear from and engage with distinguished keynote speakers, such as our host Stanislas Rohart and Dr. Rebeca Ribeiro-Palau from C2N, among others.
The event will extend beyond scientific discussions and offer participants many networking opportunities, such as the conference dinner on a scenic Seine river cruise and the social event at a local winery.
As in previous years, there will be Hands-on Sessionson Park Systems tools, showcasing basic and advanced measuring techniques, as well as tips and tricks on how to obtain stunning AFM and ISE data:
See nanoscale characterization redefined with Park’s FX200 IR AFM. From high-precision PiFM-based IR spectroscopy to automated laser alignment and advanced AFM modes, this system delivers unmatched insight into nanomechanical, electrical, and thermal properties.
Experience how Ellipsometry visualizes buried interfaces, anisotropic structures, and fluid interlayers in real time, and bring your own samples to see them come alive under the lens of Mueller Matrix Ellipsometry. And much, much more.
Park Systems Intruments, you will get to see live:
- FX200 IR AFM - integrating nanoscale infrared (IR) spectroscopy with atomic force microscopy (AFM) to deliver advanced chemical and materials characterization.
- FX40 AFM - the automatic AFM streamlines data collection, research workflows, and data publication, empowering accelerated scientific progress and discovery.
- NX10 AFM - the premier choice for cutting-edge materials science research that provides ease of use with high-resolution capabilities.
- Accurion Simon - combining the sensitivity of thickness and refractive index measurements with the imaging capabilities of microscopy.
- Lyncée Tec DHM - recording holograms produced by the interference between the beam transmitted through the sample, and a reference beam generated inside of the microscope.
Speakers
Organizer
Sponsor
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NANOscientific Symposium 2024
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