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Keynote Speaker

Prof. Dr. Tobias Cramer

Department of Physics and Astronomy "Augusto Righi", University of Bologna, Italy

Electrochemical Strain Wave Microscopy for Mapping Mixed Ionic-Electronic Transport

   

Conducting polymers with mixed ionic–electronic conductivity are central to emerging technologies in bioelectronic interfaces, neuromorphic computing, and chemical sensing. In this work, we introduce electrochemical strain wave (ESW) microscopy as a novel technique to map mixed charge transport in the channels of organic electrochemical transistors (OECTs) with microscopic spatial resolution. ESWs are generated by charge injection at the electrodes and propagate through the device via coupled ionic/electronic transport and swelling of the polymer matrix. Using atomic force microscopy, we map the local amplitude and phase of ESWs under different OECT operating conditions. Our results show that ESW microscopy enables quantitative evaluation of carrier-concentration-dependent mobility in both n-type and p-type transistors, and can sensitively detect microstructural inhomogeneities that impact local transport. This method provides a powerful framework to correlate morphology with function in OECTs, offering sub-diffraction-limit resolution of transport properties without interference from screening effects or electrochemical side reactions at the probe.

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