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Keynote Speaker

Dr. Olivier Fruchart

Deputy Director of SPINTEC, CNRS, Université Grenoble Alpes, France

E-mail

olivier.fruchart@cea.fr

Illustration of the trilemma Sensitivity – Spatial Resolution – Probe response in Magnetic Force Microscopy

In this presentation I will provide experimental illustrations of the trilemma Sensitivity / Spatial resolution / Probe characteristics in Magnetic Force Microscopy. Besides the cantilever features, sensitivity requires large forces and therefore large-magnetization and large-volume magnetic probes, which however comes at the expense of spatial resolution and sample perturbation. Spatial resolution requires small probe size, which competes with sensitivity. It is also promoted by low lift height and possibly low oscillation amplitude, which on the one hand increases the phase response, but may degrade sensitivity due to increased noise or competition with topography / electrostatic contributions. Probe response includes coercivity (to sustain external applied field and sample stray field) and low-perturbation of sample. The former is favored by thicker coatings, while the latter is favored by thinner coatings.

During the presentation I will illustrate minimization of electrostatic / topographic effects, minor loops during imaging along a hysteresis loop to tackle sample perturbation, artefacts related to tip switching during scanning, impact of lift height and oscillation amplitude on sensitivity, pros and cons of non-magnetic coating of the probe versus material engineering to decrease sample perturbation. I will also discuss the two schematically-distinct responses of a magnetic probe, i.e., first-order (stray field response) versus second order (susceptibility response), and their features versus probe and distance.

400x400 nm phase images performed along a partial perpendicular hysteresis loop of a triangular nano-array of pillars with perpendicular anisotropy and pitch 43 nm. Lift-height 10 nm, peak-to-peak oscillation 36 nm, custom tip with 20 nm magnetic coating.

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