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Keynote Speaker

Dr. Petr Klapetek

Department of Nanometrology, Czech Metrology Institute, Czech Republic

Quantitative advanced SPM data processing with Gwyddion

 

 

To make a SPM measurement quantitative, we need to focus on different aspects:
to choose suitable calibration samples, to operate the instrument the right way and to process the data obtained from the set of measurements appropriately. With advent of novel measurement regimes that extend SPM capabilities in measurement of complex mechanical, electrical, thermal magnetic or optical properties, the complexity of all the three tasks only grows.


This talk will focus on tools that can be used within Gwyddion open source software to make at least parts of it easier. This includes methods for reducing uncertainty of measurements by proper choice of scan area and resolution with respect of the measured surface topography, by choice of reference samples and by use  of methods for processing and further using the data from reference samples in different SPM modalities.


Talk will also focus on processing advanced data obtained in novel measurement regimes, like individual force-distance curves coming from off-resonance tapping regimes, high-speed image stacks or volume data representing some field distribution above the sample surface, demonstrating Gwyddion capabilities in this direction and comparing the benefits and drawbacks of storing and post-processing the complex datasets instead of their real-time analysis.

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