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Advantages of using imaging ellipsometry to characterize microcrystals such as Methylamonium-Lead-Bromide-Perovskite Microcrystals

Dr. Peter Thiesen

Park Systems GmbH Accurion, Germany

Peter received his PhD in Chemistry from Kiel University in 1996. He worked for one year on a research project for the former Wella AG and then joined the Helmut Schmidt University in Hamburg where he set up a lab for adsorption research and surface characterization - including ellipsometry. In 2006, he joined the former Nanofilm Technology GmbH as a sales manager and application specialist for Imaging Ellipsometry and Brewster Angle Microscopy. He has been a strong advocate for the benefits of Imaging Spectroscopic Ellipsometry and has presented this technique at a number of scientific conferences and workshops. He installed systems, trained users in more than 20 countries worldwide, and spend one year in Ann Arbor, Michigan with Accurion.  His research activities are reported in more than 30 scientific publications in a broad potpourri of surface chemical related topics, like the intra crystalline salinization of layered Crystalline silicic acids, SiO2 based nanofluids, protein immobilization for affinity separation technologies, hierarchical clustering of odor compounds, odor control and especially the characterization of 2D materials and other applications of Imaging Spectroscopic Ellipsometry.