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Keynote Talk

Prof. Akshay Naik

IISc Bengaluru, India

AFM: Beyond Imaging

 

Atomic force microscopy (AFM) is as a robust platform for investigating nanoscale phenomena and enabling the direct manipulation of materials with nanometer precision. In this presentation, I will discuss methods employed to address three distinct challenges in the field of nanoscience. First, AFM was employed to examine the graphene-liquid interface, uncovering local variations in monolayer graphene and interfacial interactions that dictate wetting and other properties. Second, AFM was used to fabricate controlled nanopores in ultrathin membranes. The technique provides a robust way to produce nanopores with adjustable geometries which have potential applications in molecular sensing and single-molecule transport studies. Lastly, use AFM to make site-selective indentations in two-dimensional materials to produce stable single-photon emitters, thereby paving the way for the scalable integration of quantum light sources into nanophotonic architectures. Collectively, these findings underscore the versatility of AFM for applications extending beyond high-resolution imaging.