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139 Results

Scanning Capacitance Microscopy Characterization of VacuumChannel Nanoelectronic Devices

Efforts to harden electronic components and systems using solid-state devices against the effects of radiation and heat for use in space travel have become a major engineering operation for space exploration agencies around the world. Such work has not on

17 Mar 2017
Automated Non-Destructive Imaging and Characterization of Graphene/hBN Moiré Pattern with Non-Contact Mode AFM

Graphene has attracted researchers’ attention due to its unique band gap structure, which allows it to be used in high-mobility semiconductor devices.

07 Oct 2016
Smartscan User Reviews Of Park’S Newly Launched Automated Imaging System Smartscan Are Overwhelmingly Positive

Initial Feedback from users of Park Systems SmartScan, the revolutionary point and click AFM nanoscopic tool is overwhelmingly positive, citing that SmartScan lets even inexperienced, untrained users produce high quality nanoscale imaging in five times th

07 Oct 2016
Current Trends in Spintronics and NanoStructured Materials

An Interview With Aaron Littlejohn, Dept. Of Physics, Applied Physics & Astronomy Rensselaer Polytechnic Institute Nanostructure Science Lab

26 Sep 2016
How highly efficient perovskite solar cells are visualized using AFM at Department of Energy's Lawrence Berkeley National Laboratory

An Interview With Sibel Leblebici At The Doe-Funded Molecular Foundry At Lawrence Berkeley Lab

26 Sep 2016
Accelerating Yield Improvement By Finding And Eliminating Defects Is The Key To Achieving “More Moore’S” And “More Than Moore”

Dr. John Y. Chen, VP of Technology and Foundry Operations at NVIDIA, presented an informative talk about opportunities and challenges for new applications in the semiconductor industry, titled Growing the Semiconductor Industry as Moore's Law Slows Dow

26 Sep 2016
Electrical Characterization of Semiconductor Device Using SCM and SKPM Imaging

Semiconductor devices are the foundation of modern electronics due to their importance in the function of electrical circuitry with components such as transistors, diodes, and integrated circuits. These devices have become ubiquitous in a wide range of ap

26 Sep 2016
Hair Damage From Sunlight Radiation Observed Using AFM: High School Intern Alvin Lee, Monta Vista High School

This study’s objective is to observe the effects of long term exposure of sunlight on hair fiber. Many fear the damaging effects of prolonged sunlight exposure on skin, yet few stop to think about the implications of such damage on hair.

26 Sep 2016
Glimpses of the Nanoscale

In Our Ongoing Quest To Understand And Master The World Around Us, Researchers From Various Fields Have Turned To Looking At The World At Nanometer Resolution. Investigations At These Dimensions Can No Longer Be Performed Diffraction-Limited Tools Suc

26 Sep 2016
Textile Nanocharacterization: Topography, Phase Imaging, and NanomechanicalProperty Investigation of Polyester Yarn Interaction with Silicon Matrix

Textiles research and development is rapidly turning to nanomaterials to create new fabric blends that have increased performance for traits such as damage resistance, breathability, and even self-cleaning.

26 Sep 2016
Commercializing Newest Nerve Regeneration Protocol and New Discoveries in the Field of Photonics

Dr. Rajadas is the founding director of the Biomaterials and Advanced Drug Delivery Laboratory at Stanford University. This center has been involved in transforming biophysical ideas into biomaterial and drug delivery technologies. These technologies

16 Jun 2016
Studying Post-etching Silicon Crystal on 300 mm Wafer by Automatic Defect Review AFM

Single crystal silicon wafers are the fundamental elements of semiconductor manufacturing industry. The wafers produced by Czochralski (CZ) process are very high quality single crystalline materials with known defects that are formed during the crystal gr

16 Jun 2016
Cellulose NanofibrilsTopography & Young’s Modulus Imaging Using Park Atomic Force Microscope

Carbon nanotubes (CNTs) are a popular sample for various nanotechnology studies. However, they are very difficult to synthesize en masse. As a result, researchers have started looking at alternatives with similar properties. One of the candidates to repla

16 Jun 2016
In Electrolyte Solution Topography Imaging of Various Organic Samples using Park NX10 Scanning Ion Conductance Microscopy

The Park NX10 SICM is based on the Park NX10 AFM platform. The hardware is virtually the same with the exception of an SICM head replacing the standard AFM head on the system.

16 Jun 2016
Research on Molecular Beam Epitaxy (MBE) for Integration of III-V Material Into Classical Silicon Architectures

An Interview With Dr. Christoph Friedrich Deneke, Lnnano, Brazilian Nanotechnology National Laboratory

16 Jan 2016
NanoFiber Research Creates Smart Nano Particles for Renewable Energy, Medical and Textiles

An interview with Prof. Yan Vivian Li, PhD, Assistant Professor in Fiber Science, Department of Design and Merchandising, College of Health and Human Sciences, Associate Faculty, School of Biomedical Engineering, Colorado State University

15 Jan 2016
Using Scanning Ion Conductace Microscopy (SICM) to Understand the Movement of Ions in Complex Systems

Dr. Baker’s research group at Indiana University consists of analytical and materials chemists broadly interested in electrochemistry, bioanalytical chemistry, new mass spectrometry methods, materials for electrode fabrication and instrumentation developm

15 Jan 2016
Automatic Defect Review AFM with Enhanced Vision: Essential Tool for Hard Disk Media Failure Analysis

Failure analysis engineers in data storage rely on atomic force microscope (AFM) as one of the key techniques for obtaining threedimensional information about the topological defects on hard disk media samples. This information is critical for proper iden

15 Jan 2016
Micro Gravity: The Future Of Innovation “Look Beyond Our World Of Origin To Understand Our Future”

An Interview With Ioana Cozmuta, Phd, Industry Innovation Lead, Space Portal Science And Technology Corporation

07 Oct 2015
Atomic Force Microscopy (AFM) for Optimization of Silica Chemical Inhibition in Geothermal Brines

Silica scaling has been a huge problem for geothermal plants because it significantly lowers the efficiency of heat extraction from geothermal fluids. Geothermal electricity is generated by using the geothermal energy to rotate the turbine that activates

07 Oct 2015

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Article List

Scanning Capacitance Microscopy Characterization of VacuumChannel Nanoelectronic Devices

Automated Non-Destructive Imaging and Characterization of Graphene/hBN Moiré Pattern with Non-Contact Mode AFM

Smartscan User Reviews Of Park’S Newly Launched Automated Imaging System Smartscan Are Overwhelmingly Positive

Current Trends in Spintronics and NanoStructured Materials

How highly efficient perovskite solar cells are visualized using AFM at Department of Energy's Lawrence Berkeley National Laboratory

Accelerating Yield Improvement By Finding And Eliminating Defects Is The Key To Achieving “More Moore’S” And “More Than Moore”

Electrical Characterization of Semiconductor Device Using SCM and SKPM Imaging

Hair Damage From Sunlight Radiation Observed Using AFM: High School Intern Alvin Lee, Monta Vista High School

Glimpses of the Nanoscale

Textile Nanocharacterization: Topography, Phase Imaging, and NanomechanicalProperty Investigation of Polyester Yarn Interaction with Silicon Matrix

Commercializing Newest Nerve Regeneration Protocol and New Discoveries in the Field of Photonics

Studying Post-etching Silicon Crystal on 300 mm Wafer by Automatic Defect Review AFM

Cellulose NanofibrilsTopography & Young’s Modulus Imaging Using Park Atomic Force Microscope

In Electrolyte Solution Topography Imaging of Various Organic Samples using Park NX10 Scanning Ion Conductance Microscopy

Research on Molecular Beam Epitaxy (MBE) for Integration of III-V Material Into Classical Silicon Architectures

NanoFiber Research Creates Smart Nano Particles for Renewable Energy, Medical and Textiles

Using Scanning Ion Conductace Microscopy (SICM) to Understand the Movement of Ions in Complex Systems

Automatic Defect Review AFM with Enhanced Vision: Essential Tool for Hard Disk Media Failure Analysis

Micro Gravity: The Future Of Innovation “Look Beyond Our World Of Origin To Understand Our Future”

Atomic Force Microscopy (AFM) for Optimization of Silica Chemical Inhibition in Geothermal Brines

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