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APPLICATION NOTE A Comparative Study of Atomic Force Microscopy between AM-KPFM and Sideband KPFM, Principles and Applications Research Application Technology Center, Park Systems Corporation IntroductionSince the development of Atomic Force Microscopy (AFM) [1], several measurement modes have

Figure 1. Schematic Illustration of C-AFM and SSRM AFM APPLICATIONNOTE Improved Electrical Characterization of Advanced Materials in High Vacuum​ John Paul Pineda, Charles Kim, and Byong Kim Park Systems Inc., Santa Clara, CA USA​ IntroductionSophisticated, high-performing technology often

Application-specific characterizations and analyses of carbon-based materials utilizing different microscopic technologies Manoj Aravind Sankar, Prasanna Ram 1University of California Los Angeles, Los Angeles, California 90095, United States of America2Vel Tech Rangarajan Dr.Sagunthala R&D Institute of

Gabriela Mendoza, Byong Kim and Keibock Lee, Park Systems, Inc., Santa Clara, CA, USA Introduction Probiotics are living microorganisms that provide numerous health benefits to the host when supplied in adequate amount as well as

Figure 1: (a-c) AFM topography images of the samples studied. (d) Schematic of C-AFM setup used to measure multilayer MoS2 on a sapphire. (e) Cartoon showing how the cantilever twists as it scans

Figure 1. Optical images of L929 cell for AFM (a) and SICM (b). Each probe was positioned at the apex of the single cell. Jake Kim, Moses Lee and Cathy Lee, Park Systems Corp.,

 Figure 1. Topography (top-left) resistance (top-right) and conductance (middle-left) images acquired from an LIB electrode sample. Line profile (middle-right): Topography line profile (red line, y-axis on left), resistance line profile (green, y-axis on

John Paul Pineda, Charles Kim, Cathy Lee, Byong Kim, and Keibock Lee, Park Systems Inc., Santa Clara, CA USA Introduction Scanning Kelvin probe microscopy (SKPM) is a tool used to measure work function and local electrical

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