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Jiali Zhang and Byong KimResearch Technical Services, Park Systems, Inc., USA  Figure 3. Single SECCM LSV acquired with a glass nanopipette filled with 5 mM [Ru(NH3)6]Cl3. The LSV is recorded at a sweep rate

Moses Lee, Jake Kim and Cathy LeePark Systems Corporation, Suwon, KoreaFigure 1. Illustration of a defect created before and after coating. The difference between the materials cannot be seen through the depth of

Figure 1.  PFM amplitude images. Honeycomb Moiré patterns with periodicity 15 nm on monolayer graphene/hBN (a) and (b), and with periodicity 12 nm on twisted bilayer graphene/hBN (c) and (d).  Byong Kim, John Paul

APPLICATION NOTE A Comparative Study of Atomic Force Microscopy between AM-KPFM and Sideband KPFM, Principles and Applications Research Application Technology Center, Park Systems Corporation IntroductionSince the development of Atomic Force Microscopy (AFM) [1], several measurement modes have

Figure 1. Schematic Illustration of C-AFM and SSRM AFM APPLICATION NOTE Improved Electrical Characterization of Advanced Materials in High Vacuum​ John Paul Pineda, Charles Kim, and Byong Kim Park Systems Inc., Santa Clara, CA USA​ Introduction Sophisticated, high-performing technology often

Application-specific characterizations and analyses of carbon-based materials utilizing different microscopic technologies Manoj Aravind Sankar, Prasanna Ram 1University of California Los Angeles, Los Angeles, California 90095, United States of America2Vel Tech Rangarajan Dr.Sagunthala R&D Institute of

Gabriela Mendoza, Byong Kim and Keibock Lee, Park Systems, Inc., Santa Clara, CA, USA Introduction Probiotics are living microorganisms that provide numerous health benefits to the host when supplied in adequate amount as well as

Figure 1: (a-c) AFM topography images of the samples studied. (d) Schematic of C-AFM setup used to measure multilayer MoS2 on a sapphire. (e) Cartoon showing how the cantilever twists as it scans

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